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Απο 12.04 ετρεξα το disk utility και το ειδα...

θα τρεξω και το τεστ σε λιγο

αυτό είναι το αποτέλεσμα του test

Κώδικας: Επιλογή όλων

=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K320
Device Model: Hitachi HTS543232L9A300
Serial Number: 090703FBC406CEGJGYDC
LU WWN Device Id: 5 000cca 5c3c77e0d
Firmware Version: FB4OC40J
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3f
Local Time is: Fri Jun 1 19:47:10 2012 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 127) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 091 074 062 Pre-fail Always - 65593
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0023 253 100 033 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1325
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 438 (0, 259)
7 Seek_Error_Rate 0x000f 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 2341
10 Spin_Retry_Count 0x0033 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1309
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 281470692583985
188 Command_Timeout 0x0032 001 001 000 Old_age Always - 27194
190 Airflow_Temperature_Cel 0x0022 073 045 000 Old_age Always - 27 (Min/Max 22/27)
191 G-Sense_Error_Rate 0x000a 100 098 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 3932220
193 Load_Cycle_Count 0x0032 098 098 000 Old_age Always - 22279
194 Temperature_Celsius 0x0022 203 100 000 Old_age Always - 27 (Min/Max 6/55)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 272
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 3
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x002a 200 200 000 Old_age Always - 1
223 Load_Retry_Count 0x002a 100 100 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 5
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 5 occurred at disk power-on lifetime: 702 hours (29 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d 4a 3b 68 40 Error: UNC 29 sectors at LBA = 0x00683b4a = 6830922

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f e8 3a 68 40 00 01:30:10.800 READ DMA EXT
25 00 7f 69 3a 68 40 00 01:30:10.800 READ DMA EXT
25 00 7f ea 39 68 40 00 01:30:10.800 READ DMA EXT
25 00 02 e8 39 68 40 00 01:30:10.800 READ DMA EXT
25 00 02 e8 39 68 40 00 01:30:10.800 READ DMA EXT

Error 4 occurred at disk power-on lifetime: 702 hours (29 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d 4a 3b 68 40 Error: UNC 29 sectors at LBA = 0x00683b4a = 6830922

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f e8 3a 68 40 00 01:29:54.100 READ DMA EXT
25 00 7f 69 3a 68 40 00 01:29:54.100 READ DMA EXT
25 00 7f ea 39 68 40 00 01:29:54.100 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:54.100 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:54.100 READ DMA EXT

Error 3 occurred at disk power-on lifetime: 702 hours (29 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d 4a 3b 68 40 Error: UNC 29 sectors at LBA = 0x00683b4a = 6830922

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f e8 3a 68 40 00 01:29:19.700 READ DMA EXT
25 00 7f 69 3a 68 40 00 01:29:19.700 READ DMA EXT
25 00 7f ea 39 68 40 00 01:29:19.700 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:19.700 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:19.700 READ DMA EXT

Error 2 occurred at disk power-on lifetime: 702 hours (29 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d 4a 3b 68 40 Error: UNC 29 sectors at LBA = 0x00683b4a = 6830922

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f e8 3a 68 40 00 01:29:00.400 READ DMA EXT
25 00 7f 69 3a 68 40 00 01:29:00.400 READ DMA EXT
25 00 7f ea 39 68 40 00 01:29:00.400 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:00.400 READ DMA EXT
25 00 02 e8 39 68 40 00 01:29:00.400 READ DMA EXT

Error 1 occurred at disk power-on lifetime: 702 hours (29 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d 4a 3b 68 40 Error: UNC 29 sectors at LBA = 0x00683b4a = 6830922

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f e8 3a 68 40 00 00:52:08.800 READ DMA EXT
25 00 7f 69 3a 68 40 00 00:52:08.800 READ DMA EXT
25 00 7f ea 39 68 40 00 00:52:08.800 READ DMA EXT
25 00 02 e8 39 68 40 00 00:52:08.800 READ DMA EXT
25 00 02 e8 39 68 40 00 00:52:08.800 READ DMA EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 10% 2341 6782844
# 2 Short offline Completed without error 00% 3 -
# 3 Short offline Completed without error 00% 2 -
# 4 Short offline Completed without error 00% 1 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.