Δημοσιεύτηκε: 25 Απρ 2015, 11:51
- Κώδικας: Επιλογή όλων
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-49-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: LITEONIT LCS-256M6S
Firmware Version: 1C85205
User Capacity: 256'060'514'304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA/ATAPI-7 T13/1532D revision 4a
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Apr 25 10:46:26 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 10) seconds.
Offline data collection
capabilities: (0x15) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x00) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0032 100 100 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 82
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1486
170 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
171 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 0
172 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 0
173 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 14585
174 Unknown_Attribute 0x0003 100 100 000 Pre-fail Always - 45
178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 000 Old_age Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 1440
184 End-to-End_Error 0x0033 100 100 000 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x0003 100 100 000 Pre-fail Always - 0
233 Media_Wearout_Indicator 0x0003 100 100 000 Pre-fail Always - 2311
241 Total_LBAs_Written 0x0003 100 100 000 Pre-fail Always - 36989
242 Total_LBAs_Read 0x0003 100 100 000 Pre-fail Always - 24949
SMART Error Log Version: 0
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Selective Self-tests/Logging not supported