Δημοσιεύτηκε: 18 Ιαν 2015, 22:19
λοιπον έτρεξα το smart tools (ενεργοποιημένο αυτή τη φορά) και το αποτέλεσμα είναι αυτό:
το παραπάνω αποτέλεσμα σε ένα σημείο βγάζει
5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 3
μήπως εδώ είναι το λάθος?? και συνεπώς είναι χτυπημένος ο δίσκος??
Ευχαριστώ
thewatcher
- Κώδικας: Επιλογή όλων
trixakis@trixakis-desktop:~ > sudo smartctl -s on /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-37-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.
trixakis@trixakis-desktop:~ > sudo smartctl -a /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-37-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE
Device Model: WDC WD2000JB-00FUA0
Serial Number: WD-WMAEP2777564
Firmware Version: 15.05R15
User Capacity: 200.049.647.616 bytes [200 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 (minor revision not indicated)
Local Time is: Sun Jan 18 21:12:19 2015 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6942) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 88) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 200 173 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 107 105 021 Pre-fail Always - 5191
4 Start_Stop_Count 0x0032 094 094 040 Old_age Always - 6159
5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 3
7 Seek_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 073 073 000 Old_age Always - 19997
10 Spin_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0013 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 094 094 000 Old_age Always - 6150
194 Temperature_Celsius 0x0022 114 253 000 Old_age Always - 36
196 Reallocated_Event_Count 0x0032 197 197 000 Old_age Always - 3
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0012 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0009 200 155 051 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 88 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 88 occurred at disk power-on lifetime: 930 hours (38 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e5 d9 85 f0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
01 00 25 00 00 08 00 00 01:47:41.450 [RESERVED]
01 00 25 00 00 08 00 00 01:47:41.450 [RESERVED]
00 00 60 00 00 9f 53 00 01:47:41.450 NOP [Abort queued commands]
01 00 25 00 00 68 00 00 01:47:41.450 [RESERVED]
06 00 a3 00 00 bf df 00 01:47:41.450 DATA SET MANAGEMENT
Error 87 occurred at disk power-on lifetime: 930 hours (38 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e5 d9 85 f0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
01 00 25 00 00 08 00 00 01:47:39.450 [RESERVED]
00 00 60 00 00 9f 53 00 01:47:39.450 NOP [Abort queued commands]
01 00 25 00 00 68 00 00 01:47:39.450 [RESERVED]
06 00 a3 00 00 bf df 00 01:47:39.450 DATA SET MANAGEMENT
01 00 25 00 00 80 00 00 01:47:39.450 [RESERVED]
Error 86 occurred at disk power-on lifetime: 930 hours (38 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 74 41 60 f0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
01 00 25 00 00 08 00 00 01:39:08.050 [RESERVED]
01 00 25 00 00 01 00 00 01:39:08.050 [RESERVED]
00 00 60 00 00 6f 41 00 01:39:08.050 NOP [Abort queued commands]
01 00 25 00 00 01 00 00 01:39:08.050 [RESERVED]
00 00 60 00 00 6f 41 00 01:39:08.050 NOP [Abort queued commands]
Error 85 occurred at disk power-on lifetime: 930 hours (38 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 74 41 60 f0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
01 00 25 00 00 08 00 00 01:39:06.000 [RESERVED]
00 00 60 00 00 bf 42 00 01:39:06.000 NOP [Abort queued commands]
01 00 25 00 00 08 00 00 01:39:06.000 [RESERVED]
00 00 60 00 00 3f 42 00 01:39:06.000 NOP [Abort queued commands]
01 00 25 00 00 01 00 00 01:39:06.000 [RESERVED]
Error 84 occurred at disk power-on lifetime: 930 hours (38 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 74 41 60 f0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
01 00 25 00 00 08 00 00 01:39:04.050 [RESERVED]
00 00 60 00 00 3f 42 00 01:39:04.050 NOP [Abort queued commands]
01 00 25 00 00 01 00 00 01:39:04.050 [RESERVED]
01 00 25 00 00 08 00 00 01:39:04.050 [RESERVED]
00 00 60 00 00 57 41 00 01:39:04.050 NOP [Abort queued commands]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
το παραπάνω αποτέλεσμα σε ένα σημείο βγάζει
5 Reallocated_Sector_Ct 0x0033 199 199 140 Pre-fail Always - 3
μήπως εδώ είναι το λάθος?? και συνεπώς είναι χτυπημένος ο δίσκος??
Ευχαριστώ
thewatcher