Δημοσιεύτηκε: 29 Μάιος 2012, 09:17
- Κώδικας: Επιλογή όλων
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 65536
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 123 123 024 Pre-fail Always - 187 (Average 184)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 69
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 26
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 68
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 69
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 69
194 Temperature_Celsius 0x0002 193 193 000 Old_age Always - 31 (Lifetime Min/Max 23/32)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 02 a8 95 65 01 Error: ICRC, ABRT at LBA = 0x016595a8 = 23434664
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 02 a8 95 65 e1 08 00:23:54.998 WRITE DMA
ca 00 0c 9a 95 65 e1 08 00:23:54.986 WRITE DMA
ca 00 02 96 95 65 e1 08 00:23:54.929 WRITE DMA
ca 00 02 90 95 65 e1 08 00:23:54.918 WRITE DMA
ca 00 12 78 95 65 e1 08 00:23:54.909 WRITE DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.