Δημοσιεύτηκε: 22 Ιούλ 2012, 01:11
ο δικός μου σέρνεται επειδή τάφτυσε μάλλον.
- Κώδικας: Επιλογή όλων
theo@theo:~$ sudo smartctl -a /dev/sda1
[sudo] password for theo:
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-26-generic-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Scorpio EIDE
Device Model: WDC WD600UE-22HCT0
Serial Number: WD-WXE805397453
Firmware Version: 09.07D09
User Capacity: 60.011.642.880 bytes [60,0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun Jul 22 01:07:29 2012 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3600) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 50) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 199 199 051 Pre-fail Always - 1451
3 Spin_Up_Time 0x0003 188 187 021 Pre-fail Always - 1558
4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2085
5 Reallocated_Sector_Ct 0x0033 190 190 140 Pre-fail Always - 80
7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2663
10 Spin_Retry_Count 0x0012 100 100 000 Old_age Always - 1
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1766
192 Power-Off_Retract_Count 0x0032 198 198 000 Old_age Always - 1639
193 Load_Cycle_Count 0x0032 157 157 000 Old_age Always - 130493
194 Temperature_Celsius 0x0022 096 088 000 Old_age Always - 51
196 Reallocated_Event_Count 0x0032 175 175 000 Old_age Always - 25
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 3
198 Offline_Uncorrectable 0x0010 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 1
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 1534 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1534 occurred at disk power-on lifetime: 2629 hours (109 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 40 5f 3b 82 e3 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 00 5f 3b 82 00 08 04:06:48.500 SET MULTIPLE MODE
20 00 70 2f 3b 82 03 08 04:06:45.710 READ SECTOR(S)
30 00 70 0f a2 4a 00 08 04:06:45.675 WRITE SECTOR(S)
20 00 70 87 ce 52 00 08 04:06:45.610 READ SECTOR(S)
e7 00 00 00 00 00 00 08 04:06:45.610 FLUSH CACHE
Error 1533 occurred at disk power-on lifetime: 2629 hours (109 days + 13 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 41 26 e1 2d e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 00 26 e1 2d 00 08 04:06:45.005 SET MULTIPLE MODE
20 00 80 e7 e0 2d 05 08 04:06:42.265 READ SECTOR(S)
30 00 80 a7 c6 06 00 08 04:06:42.225 WRITE SECTOR(S)
20 00 80 c7 5b 0e 00 08 04:06:42.180 READ SECTOR(S)
30 00 08 87 53 2d 00 08 04:06:42.140 WRITE SECTOR(S)
Error 1532 occurred at disk power-on lifetime: 2627 hours (109 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 40 5f 3b 82 e3 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 00 5f 3b 82 00 08 01:46:14.185 SET MULTIPLE MODE
20 00 70 2f 3b 82 03 08 01:46:11.455 READ SECTOR(S)
30 00 70 87 ce 52 00 08 01:46:11.420 WRITE SECTOR(S)
20 00 70 f7 fd 24 00 08 01:46:11.360 READ SECTOR(S)
e7 00 00 00 00 00 00 08 01:46:11.355 FLUSH CACHE
Error 1531 occurred at disk power-on lifetime: 2627 hours (109 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 41 26 e1 2d e5 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 00 26 e1 2d 00 08 01:46:11.125 SET MULTIPLE MODE
20 00 80 e7 e0 2d 05 08 01:46:08.380 READ SECTOR(S)
30 00 80 c7 5b 0e 00 08 01:46:08.340 WRITE SECTOR(S)
20 00 80 a7 75 0c 00 08 01:46:08.280 READ SECTOR(S)
30 00 20 6f 57 01 00 08 01:46:08.250 WRITE SECTOR(S)
Error 1530 occurred at disk power-on lifetime: 2627 hours (109 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 40 5f 3b 82 e3 Error:
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c6 00 00 5f 3b 82 00 08 01:46:06.855 SET MULTIPLE MODE
c4 00 70 2f 3b 82 03 08 01:46:04.240 READ MULTIPLE
c5 00 70 f7 fd 24 00 08 01:46:04.205 WRITE MULTIPLE
c4 00 70 87 2e 3b 00 08 01:46:04.155 READ MULTIPLE
c5 00 68 5f 84 0a 00 08 01:46:04.120 WRITE MULTIPLE
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 90% 2660 58866527
# 2 Short offline Completed: read failure 90% 2657 58866527
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.