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Καλημερα σε ολους! Εβαλα τους καινουργιους δισκους, μπορουμε να ριξουμε μια ματια και εδω αν ειναι ενταξη;
Ο sda ειναι TOSHIBA και ο sdb Hitachi. Μου ειχε πει το παιδι οτι θα ειναι ιδιοι αλλα... τι να πεις; Ειχα περιπετιες απ την πρωτη τους χρηση κιολας. Μου ειπε οτι θα μπορεσει να τους κανει οπως θελω, ομως τα εκανε ολα μπαχαλο. Αντι να μου κανει 4 partition σε δυο δισκους που εκανα καταλαθος 6-7 Ηρθα σπιτι αλλα δεν καταφερα να τους στρωσω μονος και ξαναπηγα την αλλη μερα σε αλλον οπου εφαγε 8 ωρες να μου στρωση τουσ δισκους. Δεν μπορουσαμε να βρουμε το grub μετα απο καθε εγκατασταση. Ηθελε αντι για grub να μου βαλει ενα: eazy b cd και δεν τον αφησα. Νομιζα οτι θα ειχα προβλημα στο μελλον.(τελικα ειμαι grub.) Ζητησε και 60 € για 4 διανομες που εβαλε, με δικα μου dvd. (εδωσα οσα ειχα, 40.)
Καπου διαβασα με το GSmartControl για δυο σφαλματα στην εκκινηση καποιου απ τους δυο δισκους. Το τεστ φαινετε παρακατω αναλυτικα. Ηθελα να δω που λεει για τις ωρες ζωης των δισκων.
TOSHIBA dev/sda:

Κώδικας: Επιλογή όλων

smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.5.0-23-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA DT01ACA050
Serial Number: Z2CZBASFS
LU WWN Device Id: 5 000039 ff2cdcdba
Firmware Version: MS1OA750
User Capacity: 500,106,780,160 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sat Feb 2 17:28:11 2013 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 5160) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 86) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 132 132 024 Pre-fail Always - 183 (Average 164)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 15
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 26
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 15
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 15
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 15
194 Temperature_Celsius 0x0002 193 193 000 Old_age Always - 31 (Min/Max 13/32)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 8 hours (0 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 31 cf f7 0a 00 Error: UNC 49 sectors at LBA = 0x000af7cf = 718799

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 40 c0 f7 0a e0 08 02:39:54.301 READ DMA
25 00 07 e8 57 38 e0 08 02:39:54.301 READ DMA EXT
25 00 40 00 57 38 e0 08 02:39:54.301 READ DMA EXT
c8 00 80 60 00 00 e0 08 02:39:54.300 READ DMA
c8 00 40 20 00 00 e0 08 02:39:54.300 READ DMA

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 26 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.