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Ο δικός μου ο δίσκος είναι γρήγορος αλλά μερικές φορές δεν κάνει boot ή κολλάει. Τα αποτελέσματα είναι αυτά:

Κώδικας: Επιλογή όλων

=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.9
Device Model: ST3160811AS
Serial Number: 6PT49HQZ
Firmware Version: 3.AAE
User Capacity: 160.041.885.696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Apr 11 20:20:24 2013 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 54) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 109 081 006 Pre-fail Always - 21729314
3 Spin_Up_Time 0x0003 099 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 3662
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 381209233
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 6954
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 097 097 020 Old_age Always - 3462
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 064 040 045 Old_age Always In_the_past 36 (Min/Max 21/36)
194 Temperature_Celsius 0x0022 036 060 000 Old_age Always - 36 (0 14 0 0 0)
195 Hardware_ECC_Recovered 0x001a 067 043 000 Old_age Always - 197444409
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 344 hours (14 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 e9 2b 1d e0 Error: UNC at LBA = 0x001d2be9 = 1911785

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 e7 2b 1d e0 00 01:23:12.735 READ DMA EXT
25 00 20 c7 2b 1d e0 00 01:23:12.573 READ DMA EXT
25 00 20 a7 2b 1d e0 00 01:23:12.494 READ DMA EXT
25 00 20 87 2b 1d e0 00 01:23:13.889 READ DMA EXT
25 00 20 67 2b 1d e0 00 01:23:13.811 READ DMA EXT

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.