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SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 081 006 Pre-fail Always - 2955063
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2633
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 380542050
9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7777
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 020 Old_age Always - 2620
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 062 048 045 Old_age Always - 38 (Min/Max 18/38)
194 Temperature_Celsius 0x0022 038 052 000 Old_age Always - 38 (0 14 0 0 0)
195 Hardware_ECC_Recovered 0x001a 070 055 000 Old_age Always - 102385660
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 43
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 5109 hours (212 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ABRT at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 ff 3c 02 00 00 e0 00 00:00:16.630 READ MULTIPLE EXT
25 ff 3c 02 00 00 e0 00 00:00:33.746 READ DMA EXT
25 ff 01 01 00 00 e0 00 00:00:33.270 READ DMA EXT
25 ff 01 00 00 00 e0 00 00:00:33.270 READ DMA EXT
ef 03 46 00 00 00 e0 00 00:00:33.243 SET FEATURES [Set transfer mode]

Error 1 occurred at disk power-on lifetime: 5109 hours (212 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1b 23 00 00 e0 Error: ICRC, ABRT 27 sectors at LBA = 0x00000023 = 35

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 ff 3c 02 00 00 e0 00 00:00:16.630 READ DMA EXT
25 ff 01 01 00 00 e0 00 00:00:16.629 READ DMA EXT
25 ff 01 00 00 00 e0 00 00:00:33.270 READ DMA EXT
ef 03 46 00 00 00 e0 00 00:00:33.270 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 e0 00 00:00:33.243 SET FEATURES [Set transfer mode]

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.



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