Δημοσιεύτηκε: 26 Μάιος 2014, 11:33
Τα φώτα σας και την βοήθειά σας και για μένα παρακαλώ (μου βγάζει 4 errors). Τί συμβαίνει;
- Κώδικας: Επιλογή όλων
george@george:~$ sudo smartctl -a /dev/sda
[sudo] password for george:
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-27-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MK..37GSX
Device Model: TOSHIBA MK1637GSX
Serial Number: 387FT312T
Firmware Version: DL030G
User Capacity: 160.041.885.696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 (minor revision not indicated)
Local Time is: Mon May 26 11:04:53 2014 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 92) minutes.
SCT capabilities: (0x0001) SCT Status supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1686
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 3573
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 479
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 030 030 000 Old_age Always - 28079
10 Spin_Retry_Count 0x0033 171 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 3535
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 237
193 Load_Cycle_Count 0x0032 093 093 000 Old_age Always - 71233
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 45 (Min/Max 9/62)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 443
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 8348
222 Loaded_Hours 0x0032 034 034 000 Old_age Always - 26508
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 293
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 4 occurred at disk power-on lifetime: 18275 hours (761 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 02 35 87 5e e0 Error: UNC 2 sectors at LBA = 0x005e8735 = 6194997
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 2f 87 5e e0 00 00:00:50.632 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:47.098 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:43.576 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 27 87 5e e0 00 00:00:36.535 READ DMA EXT
Error 3 occurred at disk power-on lifetime: 18275 hours (761 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 02 35 87 5e e0 Error: UNC 2 sectors at LBA = 0x005e8735 = 6194997
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 2f 87 5e e0 00 00:00:47.098 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:43.576 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 27 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 1f 87 5e e0 00 00:00:36.535 READ DMA EXT
Error 2 occurred at disk power-on lifetime: 18275 hours (761 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 02 35 87 5e e0 Error: UNC 2 sectors at LBA = 0x005e8735 = 6194997
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 2f 87 5e e0 00 00:00:43.576 READ DMA EXT
25 00 08 2f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 27 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 1f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 17 87 5e e0 00 00:00:36.535 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 18275 hours (761 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 02 35 87 5e e0 Error: UNC 2 sectors at LBA = 0x005e8735 = 6194997
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 2f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 27 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 1f 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 17 87 5e e0 00 00:00:36.535 READ DMA EXT
25 00 08 0f 87 5e e0 00 00:00:36.535 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
george@george:~$