Δημοσιεύτηκε: 28 Σεπ 2014, 11:46
Συμφορουμίτες εκανα κ εγω το τεστ στον σκληρο μου δισκο που τον εχω 10 χρονια ! Σε τι κατασταση βλεπετε την υγεια του ; Να παρω αμεσα backup ? Ευχαριστω εκ των προτερων !
- Κώδικας: Επιλογή όλων
smartctl 6.2 2013-07-26 r3841 [i686-linux-3.11.0-24-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K80
Device Model: HTS548060M9AT00
Serial Number: MRLB41L4G3V0HC
Firmware Version: MGBOA50A
User Capacity: 60.011.642.880 bytes [60,0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a
Local Time is: Sun Sep 28 11:24:35 2014 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 46) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 1
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 179 179 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0012 097 097 000 Old_age Always - 6133
5 Reallocated_Sector_Ct 0x0033 093 093 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 962
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 5587
191 G-Sense_Error_Rate 0x000a 085 085 000 Old_age Always - 13828096
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 344
193 Load_Cycle_Count 0x0012 089 089 000 Old_age Always - 116725
194 Temperature_Celsius 0x0002 177 177 000 Old_age Always - 31 (8 238 0 7 0)
196 Reallocated_Event_Count 0x0032 091 091 000 Old_age Always - 669
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 209 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 209 occurred at disk power-on lifetime: 462 hours (19 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 b8 4f 3d e4 Error: UNC 8 sectors at LBA = 0x043d4fb8 = 71126968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 b8 4f 3d e4 00 01:28:48.500 READ DMA
ca 00 38 80 09 0d e0 00 01:28:48.500 WRITE DMA
27 00 00 00 00 00 e0 00 01:28:48.500 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 02 01:28:48.500 IDENTIFY DEVICE
ef 03 45 00 00 00 a0 02 01:28:48.500 SET FEATURES [Set transfer mode]
Error 208 occurred at disk power-on lifetime: 462 hours (19 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 b8 4f 3d e4 Error: UNC 8 sectors at LBA = 0x043d4fb8 = 71126968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 b8 4f 3d e4 00 01:28:44.600 READ DMA
c8 00 08 b0 4f 3d e4 00 01:28:44.600 READ DMA
c8 00 08 a8 4f 3d e4 00 01:28:44.600 READ DMA
c8 00 08 a0 4f 3d e4 00 01:28:44.600 READ DMA
c8 00 08 98 4f 3d e4 00 01:28:44.600 READ DMA
Error 207 occurred at disk power-on lifetime: 462 hours (19 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 b8 b8 4f 3d e4 Error: UNC 184 sectors at LBA = 0x043d4fb8 = 71126968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 70 4f 3d e4 00 01:28:40.400 READ DMA
c8 00 00 70 4e 3d e4 00 01:28:40.200 READ DMA
c8 00 00 70 4d 3d e4 00 01:28:40.000 READ DMA
c8 00 00 70 4c 3d e4 00 01:28:39.700 READ DMA
c8 00 00 70 4b 3d e4 00 01:28:39.500 READ DMA
Error 206 occurred at disk power-on lifetime: 462 hours (19 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 b8 4f 3d e4 Error: UNC 8 sectors at LBA = 0x043d4fb8 = 71126968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 b8 4f 3d e4 00 00:38:04.600 READ DMA
27 00 00 00 00 00 e0 00 00:38:04.600 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
ec 00 00 00 00 00 a0 02 00:38:04.600 IDENTIFY DEVICE
ef 03 45 00 00 00 a0 02 00:38:04.600 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 00 00:38:04.600 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
Error 205 occurred at disk power-on lifetime: 462 hours (19 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 b8 4f 3d e4 Error: UNC 8 sectors at LBA = 0x043d4fb8 = 71126968
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 b8 4f 3d e4 00 00:38:00.700 READ DMA
c8 00 08 b0 4f 3d e4 00 00:38:00.700 READ DMA
c8 00 08 a8 4f 3d e4 00 00:38:00.700 READ DMA
c8 00 08 a0 4f 3d e4 00 00:38:00.700 READ DMA
c8 00 08 98 4f 3d e4 00 00:38:00.700 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 7703 -
# 2 Short offline Completed without error 00% 7703 -
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.