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Κώδικας: Επιλογή όλων: smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-63-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Deskstar 7K80 Device Model: HDS728080PLA380 Serial Number: PFDB32S0T1TREM LU WWN Device Id: 5 000cca 30edd0030 Firmware Version: PF2OA6EA User Capacity: 82.347.195.904 bytes [82,3 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-7 T13/1532D revision 1 Local Time is: Fri Sep 11 02:43:11 2015 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1828) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 31) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 65536 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 105 105 024 Pre-fail Always - 190 (Average 189) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 3430 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 18114 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 3286 192 Power-Off_Retract_Count 0x0032 098 098 050 Old_age Always - 3567 193 Load_Cycle_Count 0x0012 098 098 050 Old_age Always - 3567 194 Temperature_Celsius 0x0002 117 117 000 Old_age Always - 47 (Min/Max 7/58) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

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Κώδικας: Επιλογή όλων: smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-63-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG HD252KJ Serial Number: S0NJJ10LC00543 Firmware Version: CM100-06 User Capacity: 250.058.268.160 bytes [250 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA/ATAPI-7 T13/1532D revision 4a Local Time is: Fri Sep 11 02:43:41 2015 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 5471) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 93) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 1728 4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 4025 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 8265 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2342 187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 152 188 Command_Timeout 0x0032 253 253 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 063 053 000 Old_age Always - 37 194 Temperature_Celsius 0x0022 127 097 000 Old_age Always - 37 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 83248 196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 253 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 12 200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0 202 Data_Address_Mark_Errs 0x0032 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

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