Έλεγχος σκληρού δίσκου Hardware

[the_eye]

Το Raw_Read_Error_Rate δεν πρέπει πάντα να έχει 0. Είναι ένας δείκτης που αξιολογείτε μαζί με άλλους.
Σε εσένα έχει τιμή που αν δεν αυξάνει δεν είναι ανησυχητικό.

Δοκίμασε με ένα livecd αφαιρώντας τον δίσκο να δεις αν σου παγώνει το σύστημα

[Giant]

χμμ....τι εννοεις να αφαιρεσω τον δισκο??? αποπροσαρτηση???

[the_eye]

Να βγάλεις τα καλώδια που τον συνδέουν με την μητρική (καλώδιο ρεύματος και δεδομένων)

[Giant]

αστο καλυτερα....δεν το κατεχω καθολου με τα καλωδια κ αυτα!!!! και μολις ξανατεσταρα το σκληρο κ εδωσε Raw_Read_Error_Rate=0 !!!

[the_eye]

Αφού έχεις προβλήματα τότε καλύτερα να τον πας στο κατάστημα που το αγόρασες να του κάνουν έναν τεχνικό έλεγχο.

[g1wrg0s]

καλησπερα.

Κώδικας: Επιλογή όλων

Raw_Read_Error_Rate 0x000f 118 097 006 Pre-fail Always - 176690074


δηλαδη δεν ειναιι 0.
Τα Reallocated_Sector_Ct και Spin_Retry_Count ειναι 0.Το Command_Timeout παλι δεν το βρηκα.

Μπορει καποιος να μου πει αν υπαρχει προβλημα; Ευχαριστω εκ των πρωτερον.

[Learner]

Μπορει καποιος να μου πει αν υπαρχει προβλημα;

Καλύτερα να δώσεις όλα τα αποτελέσματα @g1wrg0s. Βάλε τα μέσα σε κώδικα όπως αυτό που παρέθεσες , αλλά αν τα δώσεις όλα θα βγει καλύτερη εικόνα.

[g1wrg0s]

Οριστε τα αποτελεσματα μου:

Κώδικας: Επιλογή όλων

SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 27) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 118 097 006 Pre-fail Always - 176690074
3 Spin_Up_Time 0x0003 096 095 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 096 096 020 Old_age Always - 4299
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 271771252
9 Power_On_Hours 0x0032 091 091 000 Old_age Always - 8087
10 Spin_Retry_Count 0x0013 100 099 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 020 Old_age Always - 4929
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 316
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 057 050 045 Old_age Always - 43 (Min/Max 29/44)
194 Temperature_Celsius 0x0022 043 050 000 Old_age Always - 43 (0 17 0 0)
195 Hardware_ECC_Recovered 0x001a 056 047 000 Old_age Always - 26199266
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 188 000 Old_age Always - 600
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 1179 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1179 occurred at disk power-on lifetime: 8015 hours (333 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 5f 59 5c 48 e0 Error: ICRC, ABRT 95 sectors at LBA = 0x00485c59 = 4742233

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 38 5c 48 e0 00 00:09:59.153 READ DMA
c8 00 40 78 62 48 e0 00 00:09:59.145 READ DMA
c8 00 40 78 59 48 e0 00 00:09:59.119 READ DMA
c8 00 40 f8 59 48 e0 00 00:09:59.067 READ DMA
c8 00 40 38 5a 48 e0 00 00:09:59.059 READ DMA

Error 1178 occurred at disk power-on lifetime: 8015 hours (333 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1f c1 bc 48 e0 Error: ICRC, ABRT 31 sectors at LBA = 0x0048bcc1 = 4766913

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 60 80 bc 48 e0 00 00:09:58.265 READ DMA
c8 00 60 f0 da cf e3 00 00:09:58.260 READ DMA
c8 00 c0 38 57 48 e0 00 00:09:58.197 READ DMA
c8 00 40 b8 56 48 e0 00 00:09:58.189 READ DMA
c8 00 80 f8 55 48 e0 00 00:09:58.053 READ DMA

Error 1177 occurred at disk power-on lifetime: 8015 hours (333 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 5f 19 56 48 e0 Error: ICRC, ABRT 95 sectors at LBA = 0x00485619 = 4740633

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 f8 55 48 e0 00 00:08:35.749 READ DMA
c8 00 20 d0 da cf e3 00 00:08:35.749 READ DMA
c8 00 40 b8 58 48 e0 00 00:08:35.695 READ DMA
ca 00 08 18 08 00 e0 00 00:08:35.694 WRITE DMA
ca 00 08 00 08 00 e0 00 00:08:35.694 WRITE DMA

Error 1176 occurred at disk power-on lifetime: 6436 hours (268 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 4e 91 6c 17 e5 Error: ICRC, ABRT 78 sectors at LBA = 0x05176c91 = 85421201

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 5f 80 6c 17 e5 00 02:37:34.856 READ DMA
c4 00 f8 88 6b 17 e5 00 02:37:34.855 READ MULTIPLE
ca 00 08 58 83 07 e0 00 02:37:34.854 WRITE DMA
c8 00 f8 88 6b 17 e5 00 02:37:34.798 READ DMA
c8 00 08 80 6b 17 e5 00 02:37:34.798 READ DMA

Error 1175 occurred at disk power-on lifetime: 6436 hours (268 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 d7 a9 6b 17 e5 Error: ICRC, ABRT 215 sectors at LBA = 0x05176ba9 = 85420969

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 f8 88 6b 17 e5 00 02:37:34.856 READ DMA
c8 00 08 80 6b 17 e5 00 02:37:34.855 READ DMA
e7 00 00 00 00 00 a0 00 02:37:34.854 FLUSH CACHE
ca 00 08 10 3a 62 e0 00 02:37:34.798 WRITE DMA
ca 00 08 80 a2 3e e0 00 02:37:34.798 WRITE DMA

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

[the_eye]

Έχει πρόβλημα

Κώδικας: Επιλογή όλων


1 Raw_Read_Error_Rate 0x000f 118 097 006 Pre-fail Always - 176690074
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 271771252
195 Hardware_ECC_Recovered 0x001a 056 047 000 Old_age Always - 26199266
199 UDMA_CRC_Error_Count 0x003e 200 188 000 Old_age Always - 600

[g1wrg0s]

τοτε buckup πρεπει να γινει. Προτεινετε κατι για τον σκληρο;