

Συντονιστής: adem1
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint M8 (AFT)
Device Model: SAMSUNG HN-M500MBB
Serial Number: S2R7J9CB906365
LU WWN Device Id: 5 0024e9 2061b6432
Firmware Version: 2AR10001
User Capacity: 500.107.862.016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 6
Local Time is: Thu Oct 17 00:10:57 2013 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 6600) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 110) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 5199
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 081 079 025 Pre-fail Always - 5893
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1979
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4588
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 093 093 000 Old_age Always - 7160
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1965
181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 15113824
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 902
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 055 046 000 Old_age Always - 45 (Min/Max 13/55)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 7
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x002a 001 001 000 Old_age Always - 52036
223 Load_Retry_Count 0x0032 093 093 000 Old_age Always - 7160
225 Load_Cycle_Count 0x0032 086 086 000 Old_age Always - 143217
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Τα αποτελέσματα εντολών από το τερματικό τα βάζουμε μέσα σε [cοde]αποτελέσματα[/cοde]. Επιλέγουμε το κείμενο και πατάμε το κουμπάκι . Δες εδώ πως.
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 076 045 000 Pre-fail Always - 4416
4 Start_Stop_Count 0x0032 091 091 000 Old_age Always - 10089
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0024 253 253 000 Old_age Offline - 0
9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age Always - 7463h+45m
10 Spin_Retry_Count 0x0013 100 100 049 Pre-fail Always - 2
12 Power_Cycle_Count 0x0032 095 095 000 Old_age Always - 5285
194 Temperature_Celsius 0x0022 157 064 000 Old_age Always - 27
195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 81454446
196 Reallocated_Event_Count 0x0012 098 098 000 Old_age Always - 5
197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0
198 Offline_Uncorrectable 0x0031 098 098 010 Pre-fail Offline - 5
199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail Always - 0
200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 081 006 Pre-fail Always - 2955063
3 Spin_Up_Time 0x0003 098 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 098 098 020 Old_age Always - 2633
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 380542050
9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7777
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 020 Old_age Always - 2620
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 062 048 045 Old_age Always - 38 (Min/Max 18/38)
194 Temperature_Celsius 0x0022 038 052 000 Old_age Always - 38 (0 14 0 0 0)
195 Hardware_ECC_Recovered 0x001a 070 055 000 Old_age Always - 102385660
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 43
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 5109 hours (212 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 e0 Error: ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
29 ff 3c 02 00 00 e0 00 00:00:16.630 READ MULTIPLE EXT
25 ff 3c 02 00 00 e0 00 00:00:33.746 READ DMA EXT
25 ff 01 01 00 00 e0 00 00:00:33.270 READ DMA EXT
25 ff 01 00 00 00 e0 00 00:00:33.270 READ DMA EXT
ef 03 46 00 00 00 e0 00 00:00:33.243 SET FEATURES [Set transfer mode]
Error 1 occurred at disk power-on lifetime: 5109 hours (212 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1b 23 00 00 e0 Error: ICRC, ABRT 27 sectors at LBA = 0x00000023 = 35
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 ff 3c 02 00 00 e0 00 00:00:16.630 READ DMA EXT
25 ff 01 01 00 00 e0 00 00:00:16.629 READ DMA EXT
25 ff 01 00 00 00 e0 00 00:00:33.270 READ DMA EXT
ef 03 46 00 00 00 e0 00 00:00:33.270 SET FEATURES [Set transfer mode]
ef 03 0c 00 00 00 e0 00 00:00:33.243 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Raw_Read_Error_Rate 0x000f 100 081 006 Pre-fail Always - 2955063
Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 380542050
Hardware_ECC_Recovered 0x001a 070 055 000 Old_age Always - 102385660
exit
the_eye έγραψε:Καλύτερα να πάρει ένα backup πρώτα την βάση που αναφέρει ότι έχει στον δίσκο και ότι άλλο χρειάζεται.
Εγώ έχω την εντύπωση ότι ο δίσκος είναι στα τελευταία του.