από sotos21 » 23 Ιούλ 2014, 11:46
Τι έχουμε να πούμε για τον παρακάτω δίσκο κύριοι
- Κώδικας: Επιλογή όλων
sotiris@ubuntu:~$ sudo smartctl -a /dev/sda
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.16.0-5-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K320
Device Model: Hitachi HTS543225L9SA00
Serial Number: 080612FB2F00LLG2DKJA
LU WWN Device Id: 5 000cca 55fc117e9
Firmware Version: FBEOC43C
User Capacity: 250.059.350.016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 3f
SATA Version is: SATA 2.6, 1.5 Gb/s
Local Time is: Wed Jul 23 11:28:03 2014 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 102) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 095 095 062 Pre-fail Always - 1114112
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 253 253 033 Pre-fail Always - 0
4 Start_Stop_Count 0x0012 098 098 000 Old_age Always - 3287
5 Reallocated_Sector_Ct 0x0033 073 073 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 092 092 000 Old_age Always - 3760
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2976
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 098 098 000 Old_age Always - 491
193 Load_Cycle_Count 0x0012 094 094 000 Old_age Always - 62066
194 Temperature_Celsius 0x0002 141 141 000 Old_age Always - 39 (Min/Max 8/48)
196 Reallocated_Event_Count 0x0032 068 068 000 Old_age Always - 1836
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 51
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1399 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1399 occurred at disk power-on lifetime: 3722 hours (155 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 5e 94 2a 73 e1 Error: UNC 94 sectors at LBA = 0x01732a94 = 24324756
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f 73 2a 73 e0 00 00:00:16.900 READ DMA EXT
25 00 7f f4 29 73 e0 00 00:00:12.900 READ DMA EXT
25 00 7f 75 29 73 e0 00 00:00:12.900 READ DMA EXT
25 00 7f f6 28 73 e0 00 00:00:12.900 READ DMA EXT
25 00 7f 77 28 73 e0 00 00:00:12.900 READ DMA EXT
Error 1398 occurred at disk power-on lifetime: 3722 hours (155 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 5e 94 2a 73 e1 Error: UNC 94 sectors at LBA = 0x01732a94 = 24324756
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f 73 2a 73 e0 00 00:00:15.600 READ DMA EXT
25 00 7f f4 29 73 e0 00 00:00:12.700 READ DMA EXT
25 00 7f 75 29 73 e0 00 00:00:12.700 READ DMA EXT
25 00 7f f6 28 73 e0 00 00:00:12.700 READ DMA EXT
25 00 7f 77 28 73 e0 00 00:00:12.700 READ DMA EXT
Error 1397 occurred at disk power-on lifetime: 3722 hours (155 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 61 91 2a 73 e1 Error: UNC 97 sectors at LBA = 0x01732a91 = 24324753
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f 73 2a 73 e0 00 00:00:16.800 READ DMA EXT
25 00 7f f4 29 73 e0 00 00:00:14.700 READ DMA EXT
25 00 7f 75 29 73 e0 00 00:00:14.700 READ DMA EXT
25 00 7f f6 28 73 e0 00 00:00:14.700 READ DMA EXT
25 00 7f 77 28 73 e0 00 00:00:14.700 READ DMA EXT
Error 1396 occurred at disk power-on lifetime: 3682 hours (153 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 51 3d 79 0c e9 Error: UNC 81 sectors at LBA = 0x090c793d = 151812413
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f 0f 79 0c e0 00 00:01:34.100 READ DMA EXT
25 00 7f 90 78 0c e0 00 00:01:31.400 READ DMA EXT
25 00 02 58 bb 63 e0 00 00:01:31.400 READ DMA EXT
25 00 08 78 80 04 e0 00 00:01:31.400 READ DMA EXT
25 00 02 16 77 64 e0 00 00:01:31.400 READ DMA EXT
Error 1395 occurred at disk power-on lifetime: 3682 hours (153 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 69 25 79 0c e9 Error: UNC 105 sectors at LBA = 0x090c7925 = 151812389
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f 0f 79 0c e0 00 00:00:10.800 READ DMA EXT
25 00 7f 90 78 0c e0 00 00:00:07.700 READ DMA EXT
25 00 02 58 bb 63 e0 00 00:00:07.600 READ DMA EXT
25 00 08 78 80 04 e0 00 00:00:07.600 READ DMA EXT
25 00 02 16 77 64 e0 00 00:00:07.600 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 3754 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Έκανα το τεστ γιατί η εφαρμογή "Δίσκοι" έλεγε χτες 37 ελαττωματικοί τομείς, το πρωί 47, και τώρα 51.
1 Γνώσεις Linux: Πρώτα βήματα ┃ Προγραμματισμού: Καθόλου ┃ Αγγλικών: Καθόλου
2 Ubuntu 23.10 Mantic Minotaur 6.3.0-7-generic 64bit (el_GR.UTF-8, Unity:Unity7:ubuntu unity)
3 AMD Ryzen 7 7730U with Radeon Graphics ‖ RAM 15368 MiB ‖ASUS TN3604YA - ASUS Vivobook_S_Flip TN3604YA_TN3604YA
4 Advanced Micro Devices, Inc. [AMD/ATI] Barcelo [1002:15e7] {amdgpu}
5 wlp1s0: MEDIATEK Corp. Device [14c3:7922]